XRF Analysis

We offer non-destructive X-Ray Fluorescence (XRF) to geochemically characterise stone artefacts. Geochemical analysis can be used to determine an artefact’s raw material (e.g., obsidian / matā tūhua, basalt / ōnewa, argillite / pakohe, etc.), while obsidians can usually be matched to a specific geographical source, (e.g., Tūhua / Mayor Island, Taupō, Waihi, etc.), as can some basalts (e.g., Tahanga basalt, etc.). For other stone materials, where specific sources have not been identified, it is often possible to associate an artefact with a region (e.g., Nelson argillite, Northland gabbro, etc.).

Sample requirements

To obtain accurate results, specimens need to be a minimum of 10 mm in diameter and 2 mm thick. They should be free of loose dirt but do not usually need to be washed specifically for XRF analysis.

XRF Sample Submission

Please fill out the form below and we will get back to you with a cost and postage options.